X-Ray Diffraction  –  XRD

Our laboratory is equipped with a BRUKER D2 Phaser.
This XRD – analysing tool with lots of additional accessories enables the qualitative analysis and identification of known and unknown crystalline phases of powders and thin films. High performance of the device is combined with analysis software Diffrac.EVA and the ICDD Powder Diffraction File “PDF2”.

Thin films with film thickness > 20 nm and either Ø 40 mm or 28 mm x 28 mm are analysable.
Technical data:
  • X-ray generator performance 30 kV / 10 mA
  • Energy: Cu kα (8 keV)
  • Bragg – Brentano Geometry
  • Max. angular range: - 3° 2 Theta – 160° 2 Theta
  • Min. step width: 0,005° 2 Theta
  • Achievable peak width (FWHM): < 0,1° 2 Theta
  • Sample rotation: 1 min-1 - 80 min-1
  • Detector: LYNXEYE™ (SiMicro Strip Sensor)
  • Max. integral counting rate: 108 cps


  • Bruker D2 Phaser